Layer thickness measuring instrument, digital TE 1250-0.1 F

Name: Layer thickness measuring instrument, digital TE 1250-0.1 F
Brand: SAUTER
SKU: 5770040001
Availability: OutOfStock

Производитель: SAUTER Модель: 26807

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Design:Base material ferromagnetic

Designation:TE-F

ferromagnetic base material:yes

Min./max. layer thickness of measuring range:0-1250 µm

Non-ferrous metal:no

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Layer thickness measuring instrument, digital TE 1250-0.1 F

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Описание

TC layer thickness measuring instrument

For quick and non-destructive layer thickness measurement of coatings on ferro-magnetic base materials and non-ferrous metals
With external (TE) probe
Small, handy device
Easily readable LCD display
RS-232C interface
Measurement principle
Model TE-F for measuring non-magnetic layers on a ferro-magnetic base material (steel/iron)
Model TE-N for measuring non-conductive layers (anodic oxide layer, painted surface protection etc.) on non-ferrous metals
Model TE-FN combination of both aforementioned measurement principles
Measurement range 0 to 1250 µm
Resolution < 100 µm = 0.1 µm / > 100 µm = 1 µm
Minimum strength of base material 0.3 mm
Smallest measuring area O 6 mm
Smallest curve radius: F = 1.5 mm convex, F = 25 mm concave, N = 3 mm convex, N = 50 mm concave
Accuracy ± 4 % of measured value (standard)
± 1% of measured value (two-point calibr.)
Power supply 4 x LR3 Micro, AAA
Weight 81 g
Dimensions L x W x H, 131 x 65 x 28 mm
Supplied in transport box with zero point plate, spacer foils, 4 batteries LR3 No. 5480794003 and operating manual